Click Here to Download: https://ouo.io/jfv3tE Fundamental Principles of Engineering Nanometrology By: Richard Leach Publisher: William Andrew Publishing Print ISBN: 9780080964546, 0080964540 eText ISBN: 9781437778328 Pages: 352 Copyright year: 2010 Format: EPUB Available from $ 160.00 USD SKU 9781437778328 Fundamental Principles of Engineering Nanometrology provides a comprehensive overview of engineering metrology and how it relates to micro and nanotechnology (MNT) research and manufacturing. By combining established knowledge with the latest advances from the field, it presents a comprehensive single volume that can be used for professional reference and academic study. Provides a basic introduction to measurement and instruments Thoroughly presents numerous measurement techniques, from static length and displacement to surface topography, mass and force Covers multiple optical surface measuring instruments and related topics (interferometry, triangulation, confocal , variable focus, and scattering instruments) Explains, in depth, the calibration of surface topography measuring instruments (traceability; calibration of profile and areal surface texture measuring instruments; uncertainties) Discusses the material in a way that is comprehensible to even those with only a limited mathematical knowledge Additional ISBNs 9781437778328, 1437778321
