Hermeticity Testing Of Mems And Microelectronic Packages

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    Hermeticity Testing of MEMS and Microelectronic Packages
    By: Suzanne Costello, Marc P.Y. Desmulliez
    Publisher:
    Artech House
    Print ISBN: 9781608075270, 1608075273
    eText ISBN: 9781608075287, 1608075281
    Edition: 1st
    Copyright year: 2013
    Format: PDF
    Available from $ 153.00 USD
    SKU 9781608075287
    Packaging of microelectronics has been developing since the invention of the transistor in 1947. With the increasing complexity and decreasing size of the die, packaging requirements have continued to change. A step change in package requirements came with the introduction of the Micro-Electro-Mechanical System (MEMS) whereby interactions with the external environment are, in some cases, required. This resource is a rapid, definitive reference on hermetic packaging for the MEMS and microelectronics industry, giving practical guidance on traditional and newly developed test methods. This book includes up-to-date and applicable test methods for today’s package types. The authors cover the history and development of packaging, along with a view to understanding initial hermeticity testing requirements and the subsequent limitations of these methods when applied to new package types.
     

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