Click Here to Download: https://ouo.io/dlrLnf New Horizon Testing Latent Trait Test Theory and Computerized Adaptive Testing By: David J. Weiss Publisher: Academic Press Print ISBN: 9780127427805, 0127427805 eText ISBN: 9781483297729, 1483297721 Copyright year: 1984 Format: PDF Available from $ 72.95 USD SKU 9781483297729 New Horizon Testing