Optical Compressive Imaging

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    Optical Compressive Imaging
    By: Adrian Stern
    Publisher:
    routledge
    Print ISBN: 9781498708067, 1498708064
    eText ISBN: 9781498708074, 1498708072
    Copyright year: 2016
    Format: PDF
    Available from $ 79.98 USD
    SKU 9781498708074R90
    This dedicated overview of optical compressive imaging addresses implementation aspects of the revolutionary theory of compressive sensing (CS) in the field of optical imaging and sensing. It overviews the technological opportunities and challenges involved in optical design and implementation, from basic theory to optical architectures and systems for compressive imaging in various spectral regimes, spectral and hyperspectral imaging, polarimetric sensing, three-dimensional imaging, super-resolution imaging, lens-free, on-chip microscopy, and phase sensing and retrieval. The reader will gain a complete introduction to theory, experiment, and practical use for reducing hardware, shortening image scanning time, and improving image resolution as well as other performance parameters. Optics practitioners and optical system designers, electrical and optical engineers, mathematicians, and signal processing professionals will all find the book a unique trove of information and practical guidance. Delivers the first book on compressed sensing dealing with system development for a wide variety of optical imaging and sensing applications. Covers the fundamentals of CS theory, including noise and algorithms, as well as basic design approaches for data acquisition in optics. Addresses the challenges of implementing compressed sensing theory in the context of different optical imaging designs, from 3D imaging to tomography and microscopy. Provides an essential resource for the design of new and improved devices with improved image quality and shorter acquisition times. Adrian Stern, PhD, is associate professor and head of the Electro-Optical Engineering Unit at Ben-Gurion University of the Negev, Israel. He is an elected Fellow of SPIE.
     

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