Quantum Metrology, Imaging, And Communication

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    Quantum Metrology, Imaging, and Communication
    By: David S. Simon; Gregg Jaeger; Alexander V. Sergienko
    Publisher:
    Springer
    Print ISBN: 9783319465494, 331946549X
    eText ISBN: 9783319465517, 3319465511
    Copyright year: 2017
    Format: PDF
    Available from $ 99.00 USD
    SKU 9783319465517
    This book describes the experimental and theoretical bases for the development of specifically quantum-mechanical approaches to metrology, imaging, and communication. In particular, it presents novel techniques developed over the last two decades and explicates them both theoretically and by reference to experiments which demonstrate their principles in practice. The particular techniques explored include two-photon interferometry, two-photon optical aberration and dispersion cancellation, lithography, microscopy, and cryptography.
     

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