Scanning Transmission Electron Microscopy Of Nanomaterials: Basics Of Imaging And Analysis

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Scanning Transmission Electron Microscopy Of Nanomaterials: Basics Of Imaging And Analysis
Basics of Imaging and Analysis
By: Nobuo Tanaka
Publisher:
ICP
Print ISBN: 9781848167896, 184816789X
eText ISBN: 9781783264711, 1783264713
Pages: 616
Format: EPUB
Available from $ 62.00 USD
SKU 9781783264711
The basics, present status and future prospects of high-resolution scanning transmission electron microscopy (STEM) are described in the form of a textbook for advanced undergraduates and graduate students. This volume covers recent achievements in the field of STEM obtained with advanced technologies such as spherical aberration correction, monochromator, high-sensitivity electron energy loss spectroscopy and the software of image mapping. The future prospects chapter also deals with z-slice imaging and confocal STEM for 3D analysis of nanostructured materials.Contents:
Introduction (N Tanaka)
Historical Survey of the Development of STEM Instruments (N Tanaka)
Basic Knowledge of STEM:
Basics of STEM (N Tanaka and K Saitoh)
Application of STEM to Nanomaterials and Biological Specimens (N Shibata, S D Findlay, Y Ikuhara and N Tanaka)
Theories of STEM Imaging:
Theory for HAADF-STEM and Its Image Simulation (K Watanabe)
Theory for Annular Bright Field STEM Imaging (S D Findlay, N Shibata and Y Ikuhara)
Electron Energy-Loss Spectroscopy in STEM and Its Imaging (K Kimoto)
Density Functional Theory for ELNES in STEM-EELS (T Mizoguchi)
Advanced Methods in STEM:
Aberration Correction in STEM (H Sawada)
Secondary Electron Microscopy in STEM (H Inada and Y Zhu)
Scanning Confocal Electron Microscopy (K Mitsuishi and M Takeguchi)
Electron Tomography in STEM (N Tanaka)
Electron Holography and Lorentz Electron Microscopy in STEM (N Tanaka)
Recent Topics and Future Prospects in STEM (N Tanaka)

Graduate students and researchers in the field of nanomaterials and nanostructures.