Click Here to Download: https://ouo.io/AV4Nb8 X-Ray Diffraction Topography International Series in the Science of the Solid State By: B. K. Tanner Publisher: Pergamon Print ISBN: 9780080196923, 0080196926 eText ISBN: 9781483187686, 1483187683 Copyright year: 1976 Format: PDF Available from $ 31.95 USD SKU 9781483187686 X-Ray Diffraction Topography presents an elementary treatment of X-ray topography which is comprehensible to the non-specialist. It discusses the development of the principles and application of the subject matter. X-ray topography is the study of crystals which use x-ray diffraction. Some of the topics covered in the book are the basic dynamical x-ray diffraction theory, the Berg-Barrett method, Lang’s method, double crystal methods, the contrast on x-ray topography, and the analysis of crystal defects and distortions. The crystals grown from solution are covered. The naturally occurring crystals are discussed. The text defines the meaning of melt, solid state and vapour growth. An analysis of the properties of inorganic crystals is presented. A chapter of the volume is devoted to the characteristics of metals. Another section of the book focuses on the production of ice crystals and the utilization of oxides as laser materials. The book will provide useful information to chemists, scientists, students and researchers.
